Towards Dependable RISC-V Cores for Edge Computing Devices

Published in 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2023

Recommended citation: P. R. Nikiema, A. Palumbo, A. Aasma, L. Cassano, A. Kritikakou, A. Kulmala, J. Lukkarila, M. Ottavi, R. Psiakis and M. Traiola (2023). "Towards Dependable RISC-V Cores for Edge Computing Devices." 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS). https://ieeexplore.ieee.org/abstract/document/10224862